Xiong X., Qiao Y., Xie Y., Knoll A., Lenseth K., Selvamanickam V., Rar A., Schmidt R., Chen S.Y., Martchevski M., Gogia B.
Ключевые слова: presentation, HTS, YBCO, coated conductors, high rate process, pilot-scale, critical current, homogeneity, MOCVD process, doping effect, critical current, thickness dependence, current-voltage characteristics, angular dependence, magnetic field dependence, defects columnar, microstructure, nanoscaled effects, stabilizing layers, wires multifilamentary, ac losses, coils solenoidal, ac losses, Roebel conductors, power equipment, critical caracteristics, fabrication
Xiong X., Qiao Y., Xie Y., Knoll A., Lenseth K., Selvamanickam V., Rar A., Schmidt R., Chen S.Y., Martchevski M., Gogia B.
Ключевые слова: HTS, YBCO, coated conductors, joints, mechanical properties, critical current, long conductors, homogeneity, current-voltage characteristics, joint resistances, insulation coating, FCL resistive, test results, cables three-in-one, thermal stability, economic analysis, defects, pilot-scale, measurement setup, presentation, power equipment, critical caracteristics
Xiong X., Qiao Y., Xie Y., Knoll A., Lenseth K., Selvamanickam V., Rar A., Schmidt R., Chen S.Y., Martchevski M., Gogia B.
Ключевые слова: HTS, YBCO, coated conductors, pilot-scale, capacity, IBAD process, buffer layers, high rate process, electropolishing process, collaborations, plans, economic analysis, presentation, fabrication
Xiong X., Qiao Y., Knoll A., Lenseth K., Selvamanickam V., Chen Y., Hazelton D., Rar A., Schmidt R., Gogia B., Marchevsky M., Xie Y.-.
Ключевые слова: presentation, HTS, coated conductors, pilot-scale, fabrication, cables three-in-one, grid operation, YBCO, REBCO, MOCVD process, doping effect, critical current, angular dependence, defects columnar, coils, joints, anisotropy, current-voltage characteristics, economic analysis, power equipment, critical caracteristics, status
Xiong X., Qiao Y., Knoll A., Lenseth K., Selvamanickam V., Chen Y., Hazelton D., Weber C., Rar A., Schmidt R., Gogia B., Marchevsky M., Xie Y.-.
Xiong X., Qiao Y., Xie Y., Knoll A., Lenseth K., Selvamanickam V., Chen Y., Hazelton D., Rar A., Schmidt R., Marchevsky M.
Xiong X., Qiao Y., Knoll A., Selvamanickam V., Xie Y.Y., Chen Y., Weber C.S., Lenseth K.P., Schmidt R.M., Rar A., Marchevsky M.
Xiong X., Qiao Y., Xie Y., Knoll A., Lenseth K., Selvamanickam V., Chen Y., Zhang X., Rar A., Schmidt R., Gogia B., Marchevsky M., Pethuraja G., Dutta P.
Xiong X., Xie Y., Lenseth K., Selvamanickam V., Chen Y., Zhang X., Rar A., Schmidt R., Martchevskii M., Herrin J.
Selvamanickam V.(selva@igc.com), Xiong X., Hazelton D.W., Zhang X., Tekletsadik K., Xie Y.-Y, Lenseth K.P., Schmidt R.M., Qiao Y.(yqiao@igc.com)
Ключевые слова: coated conductors, review, YBCO, coils pancake, IBAD process, MOCVD process, FCL resistive, HTS, power equipment, fabrication
Xiong X., Xie Y., Lenseth K., Selvamanickam V., Chen Y., Zhang X., Rar A., Schmidt R., Martchevskii M., Herrin J.
Xiong X., Xie Y., Lenseth K., Selvamanickam V., Chen Y., Zhang X., Rar A., Schmidt R., Martchevskii M., Herrin J.
Ключевые слова: presentation, HTS, coated conductors, YBCO, cables three-in-one, current-voltage characteristics, ac losses, coils insert, design parameters, critical current, MOCVD process, thickness dependence, hot spots, high rate process, texture, power equipment, critical caracteristics, fabrication
Xiong X., Qiao Y., Reeves J., Xie Y., Lenseth K., Selvamanickam V., Zhang X., Rar A., Schmidt R., Martchevskii M., Chen P.Y., Herrin D.H.
Ключевые слова: presentation, HTS, coated conductors, critical current, thickness dependence, MOCVD process, high rate process, long conductors, homogeneity, texture, cables three-in-one, current-voltage characteristics, ac losses, coils insert, magnets, review, YBCO, design parameters, power equipment, critical caracteristics, fabrication
Xiong X., Qiao Y., Selvamanickam V., Xie Y.Y., Hazelton D.W., Reeves J.L., Chen Y., Zhang X., Tekletsadik K., Lenseth K.P., Schmidt R.M., Rar A.
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, MOCVD process, long conductors, coils pancake, FCL resistive, review, power equipment, fabrication
Li Y., Xiong X., Qiao Y., Selvamanickam V., Reeves J.L., Chen Y., Xie Y.-Y., Lenseth K.P., Schmidt R.M., Rar A.
Ключевые слова: HTS, YBCO, coated conductors, long conductors, IBAD process, buffer layers, films epitaxial, high rate process, fabrication, length
Xiong X., Qiao Y., Reeves J., Xie Y., Lenseth K., Selvamanickam V., Chen Y., Zhang X., Rar A., Schmidt R.
Li Y., Xiong X., Qiao Y., Xie Y., Selvamanickam V., Reeves J.L., Chen Y., Lenseth K.P., Schmidt R.M.
Ключевые слова: HTS, YBCO, coated conductors, long conductors, IBAD process, buffer layers, films epitaxial, fabrication, high rate process, template layers, homogeneity, presentation, length
Li Y., Xiong X., Qiao Y., Xie Y., Reeves J.L., Chen Y., Lenseth K.P., Schmidt R.M., Selvamanickama V.
Ключевые слова: HTS, coated conductors, IBAD process, buffer layers, template layers, long conductors, fabrication, length
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